The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2008

Filed:

Jan. 15, 2003
Applicants:

Peter H. Mahowald, Las Altos, CA (US);

Wingra T. Fang, Saratoga, CA (US);

Inventors:

Peter H. Mahowald, Las Altos, CA (US);

Wingra T. Fang, Saratoga, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical transceiver connectable to a test apparatus. The optical transceiver includes a least one test apparatus interface configured to receive from the test apparatus an input causing at least a first transceiver operating parameter to have a level substantially equal to a known value, at least one sensor configured to measure a level of at least one transceiver operating parameter including the level of the first transceiver operating parameter, a data interface configured to provide a value representative of the level of the first transceiver operating parameter, and a controller. The controller is configured to receive and convert the representative value to an actual value using a defined function having a plurality of predetermined coefficients and to provide the actual value to the test apparatus via the data interface. The controller is further configured to receive from the test apparatus via the data interface a plurality of replacement coefficients determined by comparing the actual value to the known value.


Find Patent Forward Citations

Mahowald, Peter. (2008). Calibrating an optical transceiver via adaptive testing (U.S. Patent No. 7426348). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7426348

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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