The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2008

Filed:

Sep. 12, 2005
Applicant:

Hiroshi Maegawa, Kanagawa, JP;

Inventor:

Hiroshi Maegawa, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an optical information record medium including a plurality of record layers that are recordable, various signal characteristics with respect to an area X in a record layer A (second layer) among the plurality of record layers are defined under a condition that an area Y in a record layer B (first layer) adjacent to the record layer A (second layer) on an incident side thereof along an optical axis of a light beam shone on the area X is a prerecorded area. This suppresses variation and errors in the measurement of characteristics of various signals caused by the interfering light coming from an adjacent record layer, thereby making it possible to manage and define media parameters with characteristic values having high reliability, compatibility, and reproducibility.


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