The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2008
Filed:
May. 01, 2006
Applicants:
Galen E. Stansell, Kirkland, WA (US);
Tomasz Cewe, Bothell, WA (US);
Inventors:
Galen E. Stansell, Kirkland, WA (US);
Tomasz Cewe, Bothell, WA (US);
Assignee:
Cypress Semiconductor Corporation, San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test circuit can test a status of a group of non-volatile elements. A current flowing to the group of non-volatile elements can be compared against a reference value. If the current is determined to be outside of a predetermined range, the non-volatile elements can be determined to be programmed. In particular embodiments, non-volatile elements can be sections of differential one-time programmable anti-fuse latch memory elements.