The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7426021 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 16, 2008

Filed:

Nov. 28, 2005
Applicant:

Normand Cyr, Sainte-Foy, CA;

Inventor:

Normand Cyr, Sainte-Foy, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An interferometric optical analyzer apparatus comprises a light source, an interferometer and a detection system for determining the linear response, and subsequently any optical parameter, of one or more optical elements using substantially unpolarized light. In one embodiment, the light source supplies substantially unpolarized coherent light over a predetermined range of optical frequencies. The optical element is coupled in one arm of the interferometer and the other arm of the interferometer is used as a reference. The unpolarized light is first passed through the interferometer then through a three-way polarization splitter unit to split the light into at least three light beams according to preselected polarization axes corresponding to three linearly independent states of polarization. The three light beams are coupled to individual detectors and a controller computes Jones matrix elements from the resulting electrical signals. The total polarization independent power may also be determined by an additional detector.


Find Patent Forward Citations

Cyr, Normand. (2008). Interferometric optical analyzer and method for measuring the linear response of an optical component (U.S. Patent No. 7426021). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7426021

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