The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2008

Filed:

Jul. 14, 2005
Applicants:

David Jia Chen, Endwell, NY (US);

Eugene James Nosowicz, Vestal, NY (US);

Inventors:

David Jia Chen, Endwell, NY (US);

Eugene James Nosowicz, Vestal, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 2/289 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and latch circuits are provided for implementing enhanced noise immunity performance. Each latch circuit includes any L1 latch and an L2 latch coupled to the L1 latch. Data is first latched in the L1 latch during a first half clock cycle and then latched in the L2 latch during a second half clock cycle. A path opposite a latched data state is gated off in both the L1 latch and the L2 latch, where a path to a voltage supply rail is gated off with a latched low data state and a path to ground is gated off with a latched high data state.


Find Patent Forward Citations

Loading…