The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2008

Filed:

Aug. 23, 2006
Applicants:

Alex Chow, East Palo Alto, CA (US);

Robert D. Hopkins, Hayward, CA (US);

Justin M. Schauer, Palo Alto, CA (US);

Inventors:

Alex Chow, East Palo Alto, CA (US);

Robert D. Hopkins, Hayward, CA (US);

Justin M. Schauer, Palo Alto, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method for determining capacitance, a first time-varying signal is driven on a first terminal of a first capacitor and a second time-varying signal is driven on a first terminal of a second capacitor, where the first time-varying signal and the second time-varying signal have a pre-determined phase relationship with each other. These signals are received on second terminals of the first capacitor and the second capacitor and demodulated using a periodic signal to produce demodulated signals. This periodic signal has the same fundamental frequency as the first time-varying signal and the second time-varying signal. A DC component in the demodulated signals is then determined by filtering the demodulated signals, and the sign of the DC component is used to determine a relative capacitance of the first capacitor and the second capacitor.


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