The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7425830 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 16, 2008

Filed:

Nov. 05, 2003
Applicants:

Erik Banning, Houston, TX (US);

Teruhiko Hagiwara, Houston, TX (US);

Rich Ostermeier, Houston, TX (US);

Inventors:

Erik Banning, Houston, TX (US);

Teruhiko Hagiwara, Houston, TX (US);

Rich Ostermeier, Houston, TX (US);

Assignee:

Shell Oil Company, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/08 (2006.01); G01V 3/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and a system are provided for allowing determination of a direction and distance from a tool to anomaly in a formation. The apparatus for performing the method includes at least one transmitter and at least one receiver. An embodiment of the method includes transmitting electromagnetic signals from the at least one transmitter through the formation near the wellbore and detecting responses at the at least one receiver induced by the electromagnetic signals. The method may further include determining the direction from the device to the anomaly based on the detected responses. The method may also include calculating at least one of an apparent azimuth angle and an apparent dip angle based on the responses, monitoring the at least one calculated apparent angle over time, and determining the direction to the anomaly after the at least one monitored apparent angle deviates from a zero value.


Find Patent Forward Citations

Banning, Erik. (2008). System and method for locating an anomaly (U.S. Patent No. 7425830). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7425830

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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