The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2008

Filed:

Apr. 23, 2005
Applicants:

David Treves, Palo Alto, CA (US);

Thomas A. O'dell, Campbell, CA (US);

Inventors:

David Treves, Palo Alto, CA (US);

Thomas A. O'Dell, Campbell, CA (US);

Assignee:

WD Media, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01); G01N 21/00 (2006.01); G01V 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical test head comprises one or more detectors for providing output signals indicative of the condition of a workpiece surface. Data from these detectors are stored in one or more memories only when the data from the detectors satisfy one or more conditions (e.g. the data exceed than a particular threshold). The data are then passed from the one or more memories to an electrical circuit for processing. In addition, location information is stored in one or more memories and passed on to the electrical circuit when the data from the detectors satisfy the one or more conditions.


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