The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2008

Filed:

Jul. 20, 2001
Applicant:

Dimitrios Sideris, London, GB;

Inventor:

Dimitrios Sideris, London, GB;

Assignee:

Deltadot Ltd, London, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01); G01N 27/453 (2006.01); G01N 30/02 (2006.01); G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method of characterizing, in particular sequencing, polymeric samples, the system comprising: a space-time map generator for generating a space-time map of points representative of the signal peaks of signals detected at a plurality of spaced positions as passed by the migrating components of a plurality of separately-provided sample plugs; and a vertex finder for identifying vertices from the space-time map, with a single vertex being identified for the components of each separately-provided sample plug and the velocities of the sample components being determinable from the points in the space-time map.


Find Patent Forward Citations

Sideris, Dimitrios. (2008). System and method (U.S. Patent No. 7425251). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7425251

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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