The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Dec. 15, 2003
Applicant:
Young-dong Nam, Sungnam, KR;
Inventor:
Young-Dong Nam, Sungnam, KR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); H03F 1/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
Described are a filter characteristic measuring method and system capable of measuring a gain of an analog filter adapted in a DUT (Device Under Test) and a frequency response at a high speed, wherein the filter characteristic measuring method includes the steps of generating an impulse signal; applying the impulse signal to the DUT having an analog filter through a digital channel; and measuring a gain of the analog filter in the DUT and a frequency characteristic by using an output of the analog filter.
Nam, Young-Dong. (2008). Filter characteristic measuring method and system (U.S. Patent No. 7424406). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7424406
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile