The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Oct. 01, 2003
Thomas Maucksch, Tuntenhausen, DE;
Thomas Maucksch, Tuntenhausen, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A method for testing the time delay error ratio ER of a device against a maximal allowable time delay error ratio ERwith an early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability D. ns time delays TD of the device are measured, thereby ne bad time delays of these ns time delays TD are detected. PDand/or PDare obtained, whereby PDis the worst possible likelihood distribution and PDis the best possible likelihood distribution containing the measured ne bad time delays with the probability D. The average numbers of erroneous bits NEand NEfor PDand PDare obtained. NEand NEare compared with NE=ERns. If NEis higher than NEor NEis lower than NEthe test is stopped.