The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Nov. 23, 2004
Applicants:
Gunter Steinbach, Palo Alto, CA (US);
Brian J. Galloway, Campbell, CA (US);
Ken A. Nishimura, Fremont, CA (US);
Inventors:
Gunter Steinbach, Palo Alto, CA (US);
Brian J. Galloway, Campbell, CA (US);
Ken A. Nishimura, Fremont, CA (US);
Assignee:
Agilent Technologies, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods of characterizing eye diagrams are described. In one aspect, at measurement times across a measurement interval spanning at least one unit interval of the input signal, corresponding levels of the input signal are classified into groups based on at least one threshold. An eye diagram characteristic width is derived based on a distribution across the measurement interval of the levels in one of the groups.