The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Jan. 13, 2006
Xin Chen, Corning, NY (US);
Alan Frank Evans, Beaver Dams, NY (US);
Joohyun Koh, Painted Post, NY (US);
Ming-jun LI, Horseheads, NY (US);
Daniel Aloysius Nolan, Corning, NY (US);
Xin Chen, Corning, NY (US);
Alan Frank Evans, Beaver Dams, NY (US);
Joohyun Koh, Painted Post, NY (US);
Ming-Jun Li, Horseheads, NY (US);
Daniel Aloysius Nolan, Corning, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
A method for measuring fundamental mode cutoff wavelength of single polarization fiber comprising: (i) launching pulsed light of at least one wavelength λinto one end of the single polarization fiber; (ii) measuring backscattered light intensity corresponding to said wavelength to obtain the backscattered light intensity as a function of fiber position, wherein the backscattered light propagates through the same end of the fiber; and (iii) determining at least one cutoff wavelength and the corresponding position within said fiber for the cutoff wavelength, based on a specified threshold light intensity level.