The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Sep. 30, 2003
Eran Steinberg, San Francisco, CA (US);
Yury Prilutsky, San Mateo, CA (US);
Peter Corcoran, Claregalway, IE;
Petronel Bigioi, Galway, IE;
Adrian Zamfir, Bucuresti, RO;
Vasile Buzuloiu, Bucuresti, RO;
Danutz Ursu, Bucuresti, RO;
Marta Zamfir, Bucuresti, RO;
Eran Steinberg, San Francisco, CA (US);
Yury Prilutsky, San Mateo, CA (US);
Peter Corcoran, Claregalway, IE;
Petronel Bigioi, Galway, IE;
Adrian Zamfir, Bucuresti, RO;
Vasile Buzuloiu, Bucuresti, RO;
Danutz Ursu, Bucuresti, RO;
Marta Zamfir, Bucuresti, RO;
FotoNation Vision Limited, Galway, IE;
Abstract
A method of automatically correcting dust artifact within images acquired by a system including a digital camera includes determining probabilities of dust artifact regions corresponding to pixels within a digitally-acquired image based at least in part on a pixel analysis of the region in view of predetermined characteristics indicative of the presence of a dust artifact region. The dust artifact regions are associated with one or more extracted parameters relating to the optical system when the image was acquired. A statistical dust map is formed including mapped dust regions based on the dust artifact determining and associating operations. Digital data is corrected corresponding to correlated dust artifact regions within the acquired image based on the associated statistical dust map.