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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7424170 B1

PDFFull Text
Expired
Date of Patent:
Sep. 09, 2008

Filed:

Sep. 30, 2003

Automated statistical self-calibrating detection and removal of blemishes in digital images based on determining probabilities based on image analysis of single images

Applicants:

Eran Steinberg, San Francisco, CA (US);

Yury Prilutsky, San Mateo, CA (US);

Peter Corcoran, Claregalway, IE;

Petronel Bigioi, Galway, IE;

Adrian Zamfir, Bucuresti, RO;

Vasile Buzuloiu, Bucuresti, RO;

Danutz Ursu, Bucuresti, RO;

Marta Zamfir, Bucuresti, RO;

Inventors:

Eran Steinberg, San Francisco, CA (US);

Yury Prilutsky, San Mateo, CA (US);

Peter Corcoran, Claregalway, IE;

Petronel Bigioi, Galway, IE;

Adrian Zamfir, Bucuresti, RO;

Vasile Buzuloiu, Bucuresti, RO;

Danutz Ursu, Bucuresti, RO;

Marta Zamfir, Bucuresti, RO;

Assignee:

FotoNation Vision Limited, Galway, IE;

Attorneys:

Andrew V. Smith

Jackson & Co., LLP

Primary Examiner:

Yosef Kassa

Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of automatically correcting dust artifact within images acquired by a system including a digital camera includes determining probabilities of dust artifact regions corresponding to pixels within a digitally-acquired image based at least in part on a pixel analysis of the region in view of predetermined characteristics indicative of the presence of a dust artifact region. The dust artifact regions are associated with one or more extracted parameters relating to the optical system when the image was acquired. A statistical dust map is formed including mapped dust regions based on the dust artifact determining and associating operations. Digital data is corrected corresponding to correlated dust artifact regions within the acquired image based on the associated statistical dust map.

Find Patent Forward Citations

Steinberg, Eran. (2008). Automated statistical self-calibrating detection and removal of blemishes in digital images based on determining probabilities based on image analysis of single images (U.S. Patent No. 7424170). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7424170

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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