The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2008

Filed:

Oct. 04, 2005
Applicants:

Daniel Al-salameh, Marlboro, NJ (US);

David J. Dougherty, Mountain View, CA (US);

Inventors:

Daniel Al-Salameh, Marlboro, NJ (US);

David J. Dougherty, Mountain View, CA (US);

Assignee:

JDS Uniphase Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for monitoring spectral tilt uses an arrayed waveguide grating (AWG) to separate a multiplexed optical signal having a plurality of wavelength channels into a plurality of sub-bands, where each sub-band spans a different wavelength range and includes more than one wavelength channel. A photodetector array is provided to measure the optical power in each of the sub-bands, while control electronics calculate spectral tilt of the multiplexed optical signal using the measured optical power in each of the sub-bands. The spectral tilt monitor in accordance with the instant invention provides spectral resolution, increased monitoring speeds, and decreased manufacturing costs.


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