The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Sep. 01, 2005
Jesse R. Borders, Lexington, KY (US);
Chengwu Cui, Lexington, KY (US);
Larry L Kiser, Scottsville, NY (US);
Jesse R. Borders, Lexington, KY (US);
Chengwu Cui, Lexington, KY (US);
Larry L Kiser, Scottsville, NY (US);
Lexmark International, Inc., Lexington, KY (US);
Abstract
Methods of identifying the location and dimensions of a contaminant particle on a calibration strip comprise imaging a calibration strip comprising a plurality of channels and a plurality of pixel columns. The method also includes generating a normalized local average pixel intensity value and locating a contaminant particle in a pixel column by comparing the intensity of an individual pixel in the pixel column to the normalized local average pixel intensity value. An intensity value of an individual pixel less than a predefined limit set below the normalized local average pixel intensity value corresponds to a location of a contaminant particle. The method further includes identifying the number of adjacent pixels in a pixel column less than a predefined limit set below the normalized local average pixel intensity value.