The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Oct. 11, 2002
Wolf Steffens, Herrenberg, DE;
Ulrich Kallmann, Tuebingen, DE;
Bernd Nebendahl, Ditzingen, DE;
Emmerich Mueller, Aidlingen, DE;
Ralf Haeussler, Gaertringen, DE;
Wolf Steffens, Herrenberg, DE;
Ulrich Kallmann, Tuebingen, DE;
Bernd Nebendahl, Ditzingen, DE;
Emmerich Mueller, Aidlingen, DE;
Ralf Haeussler, Gaertringen, DE;
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
An apparatus and to a method of monitoring an interferometer, comprising the steps of: coupling a first optical signal into the interferometer and into a wavelength reference element, detecting a first resulting interference signal being a result of interference of parts of the first optical signal in the interferometer, detecting a resulting reference signal of the wavelength reference element, the resulting reference signal being a result of interaction of the first optical signal with the wavelength reference element, and comparing the first resulting interference signal with the resulting reference signal to detect a drift of the interferometer, if any.