The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2008

Filed:

Jan. 11, 2007
Applicants:

John P. Wysokowski, Fairport, NY (US);

Scott E. Stickel, Rochester, NY (US);

Alan R. Bentz, Bergen, NY (US);

Inventors:

John P. Wysokowski, Fairport, NY (US);

Scott E. Stickel, Rochester, NY (US);

Alan R. Bentz, Bergen, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for measuring web planarity includes a horizontal reference surface and a light source for projecting a light pattern onto the reference surface at an angle. A web is supported above the reference surface. An imaging device detects (1) positions on the reference plane of interception of discrete regions of the projected light pattern and (2) respective positions on the web of interception of the same discrete regions of the projected light pattern. The imaging device determines the vertical offset of the respective positions on the web as a function of differences in the detected positions on the reference plane and the respective detected positions on the web. A measure of non-planarity of the web is calculated based upon a comparison of a plurality of such vertical offsets from a plurality of detected positions of the web.


Find Patent Forward Citations

Loading…