The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Nov. 03, 2005
Jon A. Hoshizaki, Cupertino, CA (US);
Howard Gregg King, Berkeley, CA (US);
Johannes P. Sluis, Redwood City, CA (US);
Steven J. Boege, San Mateo, CA (US);
Mark F. Oldham, Los Gatos, CA (US);
Jon A. Hoshizaki, Cupertino, CA (US);
Howard Gregg King, Berkeley, CA (US);
Johannes P. Sluis, Redwood City, CA (US);
Steven J. Boege, San Mateo, CA (US);
Mark F. Oldham, Los Gatos, CA (US);
Applera Corporation, Foster City, CA (US);
Abstract
Methods and optical systems for scanning of a target sample, including methods and systems using a low mass scan head and methods and systems for conducting a scanned optically transduced assay where the scanning includes at least one first relative angular motion and at least one second angular motion or at least one linear motion. The present invention also relates to methods and systems for performing sample assays, and for producing and measuring optical responses and signatures.