The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Jul. 17, 2006
Richard Lewison, Cary, NC (US);
Vincent Acierno, Chapel Hill, NC (US);
Klaus Hummler, Apex, NC (US);
Richard Lewison, Cary, NC (US);
Vincent Acierno, Chapel Hill, NC (US);
Klaus Hummler, Apex, NC (US);
Qimonda North America Corp., Cary, NC (US);
Abstract
Trim codes are determined for semiconductor devices under test (DUTs), wherein the trim codes correspond to voltage or current reference value adjustments that cause the DUTs to generate desired voltage or current reference values. The technique involves supplying respective trim codes simultaneously to the DUTs to cause them to generate trimmed analog voltage or current references, simultaneously feeding a test analog voltage or current reference having a preselected reference value to the DUTs, and for each DUT, comparing the value of the test analog reference to the values of the trimmed analog references to ascertain the crossing of the value of the test analog reference by the values of the trimmed references, whereby for each DUT the trim code corresponding to the value of the trimmed analog voltage or current reference immediately above or below the crossing is established as the preferred trim code to be used for that DUT.