The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Feb. 28, 2005
James E. Clayton, Henderson, NV (US);
Paul Bjorkholm, Newport Beach, NY (US);
James E. Clayton, Henderson, NV (US);
Paul Bjorkholm, Newport Beach, NY (US);
Varian Medical Systems Technologies, Inc., Palo Alto, CA (US);
Abstract
In accordance with an embodiment, a method of examining contents of an object is disclosed comprising conducting a first examination of an object, checking for the presence of delayed neutrons if the first examination indicates that suspect material is present, and determining whether the object contains nuclear material based, at least in part, on the check. The first examination may comprise a manual examination and scanning of the object to form an image, for example. The first examination may also comprise scanning of the object at two different radiation energies, calculating a function of the energy detected at the two radiation energies, and determining whether the object at least potentially contains suspect material based, at least in part, on the comparison. Systems are also disclosed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile