The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2008

Filed:

Jun. 08, 2007
Applicant:

Osamu Fukuroi, Laguna, PH;

Inventor:

Osamu Fukuroi, Laguna, PH;

Assignee:

SAE Magnetics (H.K.) Ltd., Hong Kong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 49/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An element for detecting an amount of lapping of a stacked structure that includes a substrate and a magnetic field detecting sensor is provided. The element comprises: a resistive film that is arranged on a lapping surface of the stacked structure, the resistive film being exposed at the lapping surface together with the magnetic field detecting sensor, wherein the resistive film has a resistance value that varies depending on the amount of lapping; and a pad for measuring the resistance value, wherein the pad is formed on a surface of the stacked structure, the surface being other than the lapping surface, and wherein the pad is electrically connected to one end of the resistive film. Another end of the resistive film is electrically connected to the substrate.


Find Patent Forward Citations

Loading…