The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Mar. 24, 2006
Tadashi Yamane, Tokyo, JP;
Yasuhiko Katsube, Tokyo, JP;
Takashi Sato, Tokyo, JP;
Albert J. Parvin, San Antonio, TX (US);
Rolf Glauser, San Antonio, TX (US);
James F. Crane, San Antonio, TX (US);
Tadashi Yamane, Tokyo, JP;
Yasuhiko Katsube, Tokyo, JP;
Takashi Sato, Tokyo, JP;
Albert J. Parvin, San Antonio, TX (US);
Rolf Glauser, San Antonio, TX (US);
James F. Crane, San Antonio, TX (US);
The Tokyo Electric Power Company, Incorporated, Tokyo, JP;
Abstract
A nondestructive inspection apparatus is designed to inspect components in a small gap of a structure. A main bodyof the nondestructive inspection apparatus is positioned on a spray line headerconnected to a thermal sleevewithin a cooling water inlet nozzle, and fixed to a core spray lineby vertically clamping the core spray linewith fixing unitsat the position where the thermal sleeveto be inspected is located. Scannersinsert a tape probehaving an inspection headinside an annular gapformed between the thermal sleeveand the cooling water inlet nozzlein an axial direction. The scannersare guided by guide railsto move the tape proveso that the inspection headcan move in the circumferential direction of the annular gap