The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2008

Filed:

Jan. 20, 2006
Applicants:

Jean-yves Francois Roger Chatellier, Arcueil, FR;

Richard Michael Coulette, Gentilly, FR;

Inventors:
Assignee:

Snecma, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/06 (2006.01); G01N 29/26 (2006.01); G01N 29/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of inspecting a part in immersion using a focused beam of ultrasound waves oriented perpendicularly to the surface of the part, the method including, when the axis of the focused beam is close to an edge of the part, tilting the axis towards the edge relative to the normal to the surface of the part in order to eliminate the lateral shadow zone over all or substantially all of the depth of the part.


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Chatellier, Jean-Yves Francois Roger. (2008). Method of using ultrasound to inspect a part in immersion (U.S. Patent No. 7421901). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7421901

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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