The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2008

Filed:

Dec. 07, 2001
Applicants:

Miriam G. Blatt, Menlo Park, CA (US);

David J. Greenhill, Portola Valley, CA (US);

Claude R. Gauthier, Fremont, CA (US);

Kathirgamar Aingaran, Sunnyvale, CA (US);

Inventors:

Miriam G. Blatt, Menlo Park, CA (US);

David J. Greenhill, Portola Valley, CA (US);

Claude R. Gauthier, Fremont, CA (US);

Kathirgamar Aingaran, Sunnyvale, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for data analysis of power modeling for a microprocessor has been developed. The method takes multiple values of power data from a power modeling simulator and generates summary data to characterize the power data behavior. Summary data views include results characterizing behavior in a single cycle and behavior across multiple cycles. Data is viewed both at an absolute level to characterize total power and relative to previous levels to characterize power derivatives. Summary data is derived from power generated every cycle when running specific benchmark programs on the power simulator.


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