The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2008

Filed:

Nov. 17, 2005
Applicants:

Charles Q. Zhan, Chandler, AZ (US);

Joseph Z. LU, Glendale, AZ (US);

Inventors:

Charles Q. Zhan, Chandler, AZ (US);

Joseph Z. Lu, Glendale, AZ (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method includes identifying a signal and a disturbance associated with a model. The signal and disturbance are identified using historical data associated with one or more process variables. The method also includes decomposing the signal and the disturbance at a plurality of resolution levels. The method further includes extracting a plurality of data segments from the signal using the decomposed signal and the decomposed disturbance. In addition, the method includes determining a quality of the model using the extracted data segments and at least a portion of the historical data.


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