The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2008

Filed:

Jun. 22, 2004
Applicants:

Graeme Ralph Duffill, Boulder, CO (US);

Andrew Timothy Patten, Boulder, CO (US);

Mark James Bell, Arvada, CO (US);

Inventors:

Graeme Ralph Duffill, Boulder, CO (US);

Andrew Timothy Patten, Boulder, CO (US);

Mark James Bell, Arvada, CO (US);

Assignee:

Micro Motinn, Inc., Boulder, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/76 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A meter electronics and method for detecting a residual material in a flow meter assembly are provided according to the invention. The meter electronics includes a processing system adapted to direct the flow meter to vibrate the flow meter assembly and receive a vibrational response from the flow meter assembly. The meter electronics further includes a storage system configured to store flow meter parameters and data. The meter electronics is further characterized by the processing system being configured to compare the vibrational response to a predetermined residual material threshold to detect the residual material.


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