The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2008

Filed:

Dec. 04, 2007
Applicants:

Akira Mori, Owariasahi, JP;

Muneharu Nakabayashi, Owariasahi, JP;

Inventors:

Akira Mori, Owariasahi, JP;

Muneharu Nakabayashi, Owariasahi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technology that increases bill discrimination precision, wherein a bill discriminating apparatus detects the thickness distribution of a bill P that is subject to discrimination, and by comparing this thickness distribution data and the reference thickness distribution data that shows the thickness distribution of an authentic note held in advance, performs discrimination processing that includes double feed detection, tape detection, and authenticity discrimination. Then, authenticity discrimination is performed on areas for which the difference between the thickness distribution data and the reference thickness data is within a specified range.


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