The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2008
Filed:
Sep. 13, 2007
Vikram Bhatia, Painted Post, NY (US);
Jacques Gollier, Painted Post, NY (US);
Martin Hai HU, Painted Post, NY (US);
David August Sniezek Loeber, Horseheads, NY (US);
Daniel Ohen Ricketts, Corning, NY (US);
Vikram Bhatia, Painted Post, NY (US);
Jacques Gollier, Painted Post, NY (US);
Martin Hai Hu, Painted Post, NY (US);
David August Sniezek Loeber, Horseheads, NY (US);
Daniel Ohen Ricketts, Corning, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
Particular embodiments of the present invention relate generally to semiconductor lasers and laser scanning systems and, more particularly, to schemes for controlling semiconductor lasers. According to one embodiment of the present invention, a laser is configured for optical emission of encoded data. At least one parameter of the optical emission is a function of a drive current Iinjected into the gain section of the semiconductor laser and one or more additional drive currents I/V, I/V. Mode selection in the semiconductor laser is altered by perturbing at least one of the additional drive currents I/V, I/Vwith a perturbation signal I/Vto alter mode selection in the semiconductor laser such that a plurality of different emission modes are selected in the semiconductor laser over a target emission period. In this manner, patterned variations in the wavelength or intensity profile of the laser can be disrupted to disguise patterned flaws that would otherwise be readily noticeable in the output of the laser.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile