The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7420758 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 02, 2008

Filed:

Jan. 05, 2004
Applicants:

Yasutoshi Inoue, Tokyo, JP;

Hiroaki Hida, Chiba, JP;

Toshiaki Wakita, Kanagawa, JP;

Tetsuro Makise, Tokyo, JP;

Ichiro Hashimoto, Kanagawa, JP;

Inventors:

Yasutoshi Inoue, Tokyo, JP;

Hiroaki Hida, Chiba, JP;

Toshiaki Wakita, Kanagawa, JP;

Tetsuro Makise, Tokyo, JP;

Ichiro Hashimoto, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a head system including a plurality of recording heads for azimuth recording. The system includes a first recording head having a plurality of magnetic gaps having a first azimuth angle, and a second recording head having a plurality of magnetic gaps having a second azimuth angle different from the first azimuth angle. After first magnetization patterns are formed on a recording medium by the first recording head, second magnetization patterns are formed by overwriting side edge portions in the formation direction of the first magnetization patterns by the second recording head. This makes it possible to prevent the worsening of the accuracy of the magnetization pattern width due to a relative height stagger (offset) between the heads, to thereby enhance the accuracy of the magnetization pattern width, and to achieve high-density recording.


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