The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2008

Filed:

Aug. 20, 2007
Applicants:

Richard Scott Hinks, Waukesha, WI (US);

Bryan James Mock, Lake Mills, WI (US);

Frederick Joseph Frigo, Waukesha, WI (US);

Xiaoli Zhao, New Berlin, WI (US);

Inventors:

Richard Scott Hinks, Waukesha, WI (US);

Bryan James Mock, Lake Mills, WI (US);

Frederick Joseph Frigo, Waukesha, WI (US);

Xiaoli Zhao, New Berlin, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an apparatus and method of phase correction whereby changes in phase characteristics are measured during data acquisition and, accordingly, phase correction parameters that are applied during image reconstruction are updated in real-time. This adaptive and dynamic phase correction reduces variability in image fidelity during the course of long MR scans, such as EPI scans, and provides consistent artifact reduction during the course of an MR scan.


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