The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2008

Filed:

Mar. 27, 2003
Applicants:

Robert S. Dubrow, San Carlos, CA (US);

Luc J. Bousse, Los Altos, CA (US);

Huan L. Phan, Belmont, CA (US);

Inventors:

Robert S. Dubrow, San Carlos, CA (US);

Luc J. Bousse, Los Altos, CA (US);

Huan L. Phan, Belmont, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract

Devices, systems and methods for use in separating sample materials into different sample components and then isolating one or more of the sample components for further processing or analysis are disclosed. Devices employ configurations that optionally allow a sample material to be electrophoretically separated into sample components in a separation matrix within a separation conduit. The sample components may then be detected in a detection zone in the separation conduit, and then selected components shunted to a component collection conduit within the device downstream of the detection zone for further processing or analysis based on information received at the detection zone. Methods of using these devices, and systems that incorporate these devices are also envisioned.


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