The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2008
Filed:
Mar. 29, 2002
Akihiko Uchiyama, Yokohama, JP;
Kenji Yanashima, Ichikawa, JP;
Sunao Takeda, Ichikawa, JP;
Go Taguchi, Tokyo, JP;
Takuro Yokoyama, Tokyo, JP;
Akihiko Uchiyama, Yokohama, JP;
Kenji Yanashima, Ichikawa, JP;
Sunao Takeda, Ichikawa, JP;
Go Taguchi, Tokyo, JP;
Takuro Yokoyama, Tokyo, JP;
Waseda University, Totsuka-cho, Shinjuku-ku, Tokyo, JP;
Kowa Company, Ltd., Nishiki 3-chome, Naka-ku, Nagoya-shi, Aichi, JP;
Abstract
An intraocular tension measuring method comprising vibrating an eyeball to be examined by a sound wave, measuring vibration of the eyeball to be examined by a noninvasive means to determine a Q value of resonance of the eyeball to be examined, and calculating intraocular tension from the Q value, and an intraocular tension measuring device comprising a vibrating means for vibrating an eyeball to be examined by a sound wave, a measuring means for noninvasively measuring vibration of the eyeball to be examined, a Q value calculating means for calculating a Q value of resonance of the eyeball to be examined from the vibration measured by the measuring means, and an intraocular tension calculating means for calculating intraocular tension from the Q value.