The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2008

Filed:

Mar. 27, 2003
Applicants:

Seiji Tatsuta, Hachioji, JP;

Toshiyuki Ebihara, Hino, JP;

Yasuhiro Komiya, Hino, JP;

Ken Ioka, Hachioji, JP;

Inventors:

Seiji Tatsuta, Hachioji, JP;

Toshiyuki Ebihara, Hino, JP;

Yasuhiro Komiya, Hino, JP;

Ken Ioka, Hachioji, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 29/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A format storage unit stores a predetermined geometric property format. A chart data creating unit creates chart data based upon the geometric property format, and a printing unit creates a test chart by printing mark groups on a recording medium such as a paper sheet based upon the chart data. An image pickup unit outputs a chart image by scanning the test chart, and a mark center calculating unit calculates the center of each mark based upon the chart image. A fitting unit performs a fitting calculation comparing calculation results output from the mark center calculating unit and the chart based upon the geometric property format such that the squared difference therebetween becomes minimum for each mark position.


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