The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7418875 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 02, 2008

Filed:

Aug. 09, 2006
Applicants:

Kohji Kohno, Osaka, JP;

Sachihiko Maeda, Osaka, JP;

Inventors:

Kohji Kohno, Osaka, JP;

Sachihiko Maeda, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A tension measuring apparatus and method for a chain by which tension applied to the chain is correctly and reproducibly measured is disclosed and claimed. A tension measuring method for a chain () comprising a pair of right and left inner plates (), bushes () press-fit between the inner plates (), a pair of right and left outer plates () disposed on both outsides of the inner plates (), connecting pins () loosely inserted into the bush () and press-fit between the outer plates (), and connected to each other characterized in that a strain gauge is applied to a position having a relation of a ratio of 1 to 1 between tension applied to the chain and an output of the strain gauge ().


Find Patent Forward Citations

Kohno, Kohji. (2008). Tension measuring method and apparatus for chain (U.S. Patent No. 7418875). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7418875

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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