The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2008
Filed:
Oct. 31, 2003
Douglas C. Allan, Corning, NY (US);
Motoya Anma, Tokyo, JP;
Josef C. Lapp, Corning, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
A method of determining parameters of plurality of thermal cycles to achieve a set glass strain level includes providing a plurality of input parameters for a glass substrate and a plurality of parameters for a plurality of thermal cycles. The method also includes iteratively modifying at least one of the pluralities of thermal cycle parameters so the glass strain is not greater than the set glass strain level after a final thermal cycle is completed. An aspect of the method usefully enables a user to determine from the material parameters and processing sequences of the glass manufacturer and further entities that may further process the glass (e.g., the glass manufacturer's customers) whether a particular glass strain can be achieved; and if not the example embodiments allows the manufacturer to calculate changes in the customers' processes to meet the desired glass strain.