The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7418125 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 26, 2008

Filed:

Sep. 30, 2004
Applicant:

Tomoyuki Miyashita, Tochigi, JP;

Inventor:

Tomoyuki Miyashita, Tochigi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/68 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for detecting a position of a region, corresponding to a mark, in image data, as a mark position, the mark including periodically arranged patterns. A first unit obtains a real-space energy distribution which corresponds to an energy spectrum distribution of each partial area of the image data. A probability distribution obtaining unit obtains a probability distribution based on the real-space energy distribution, the probability distribution indicating repetitive positions of the periodically arranged patterns and the intensity of periodicity at this position. A second unit obtains a degree of correlation between each probability distribution obtained by the probability distribution obtaining unit and a pre-registered probability distribution of the mark, and a third unit obtains the mark position based upon the degrees of correlation obtained by the second unit.


Find Patent Forward Citations

Miyashita, Tomoyuki. (2008). Position detection technique (U.S. Patent No. 7418125). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7418125

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