The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2008
Filed:
Jul. 11, 2005
Masanori Aratani, Kanagawa, JP;
Yasuhiro Iihara, Kanagawa, JP;
Masaki Kudoh, Tokyo, JP;
Junzoh Noda, Kanagawa, JP;
Masahiro Shimizu, Kanagawa, JP;
Masanori Aratani, Kanagawa, JP;
Yasuhiro Iihara, Kanagawa, JP;
Masaki Kudoh, Tokyo, JP;
Junzoh Noda, Kanagawa, JP;
Masahiro Shimizu, Kanagawa, JP;
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
Embodiments of the present invention provide an inspection method for detecting a physical defect of a magnetic disk with high sensitivity without increasing the length of inspection time. In a magnetic disk drive according to one embodiment, the assembling of which has been completed, by reading inspection data written to a magnetic disk, a defect of the magnetic disk is detected in a state in which a read error occurs. Redundant bits of an ECC are added to the inspection data. If a head corresponding to a recording surface to be inspected has superior read performance, an ECC 2 is applied. If the head in question has inferior read performance, an ECC 4 is applied. Accordingly, as compared with a case where a single ECC is applied, the defect detectivity is further improved without increasing the length of inspection time.