The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2008

Filed:

Feb. 04, 2005
Applicants:

Shigeyuki Baba, Tokyo, JP;

Nobuhiro Kihara, Kanagawa, JP;

Inventors:

Shigeyuki Baba, Tokyo, JP;

Nobuhiro Kihara, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus is disclosed which can reproduce multi-value data with high reproducibility from a hologram recording medium having data recorded in multi-values therein and can reduce the error rate of reproduction data. A reference gradation pattern is recorded in a medium, and luminance unevenness of a gradation pattern obtained by reproducing the gradation pattern is corrected. A gamma characteristic of the medium is determined based on the reproduction gradation pattern, and a modulation pattern produced using easily separable luminance values determined based on the gamma characteristic is displayed on a spatial light modulator to record data in multi-values into the medium. Thereupon, the data are oversampled and recorded, and a block of the reproduced data is decoded depending upon a sequence of relative luminance levels of pixels in the block to decode the entire reproduced multi-value data.


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