The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2008
Filed:
Apr. 28, 2005
Richard L. Fox, Corning, NY (US);
Kiat C. Kang, Corning, NY (US);
Andru J. A. Prescod, Corning, NY (US);
Richard L. Fox, Corning, NY (US);
Kiat C. Kang, Corning, NY (US);
Andru J. A. Prescod, Corning, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
A method of measuring dimensional changes in a transparent substrate includes forming an array of reference markers on a reference plate, forming an array of substrate markers on the transparent substrate, stacking the reference plate and transparent substrate such that the reference markers and substrate markers overlap, measuring coordinates of the substrate markers relative to coordinates of the reference markers before and after processing the transparent substrate, and determining dimensional changes in the transparent substrate from the difference between the measured relative coordinates of the substrate markers before and after processing the transparent substrate.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile