Compensation for leakage current from dynamic storage node variation by the utilization of an automatic self-adaptive keeper

Abstract

A method and system for automatically detecting and optimally compensating a wide range of die leakage currents in dynamic circuits is presented. A self-adaptive keeper tracks the leakage and reduces the leakage effects by optimally controlled compensation current. The self-adaptive keeper utilizes a 2-stage embedded current mirror circuit, a dummy cell and a keeper transistor to compensate leakage current. The load impact of the self-adaptive keeper on the dynamic circuit components (for example, the impact on memory cells) is minimized by a dummy cell which detects and matches the instant leakage current. Amplification in the 2-stage embedded current mirror circuit provides an optimal current strength in the keeper transistor. The optimally amplified leakage current is utilized to compensate for a leakage induced voltage drop at the circuit's output. Thus, the self-adaptive keeper ensures the robustness of the circuit in real time and does not create any negative trade-off on read latency.