The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2008

Filed:

May. 17, 2005
Applicants:

Nozomu Hachisuka, Tokyo, JP;

Kenji Inage, Tokyo, JP;

Norio Takahashi, Tokyo, JP;

Tatsushi Shimizu, Shatin, CN;

Pak Kin Wong, Shatin, CN;

Inventors:

Nozomu Hachisuka, Tokyo, JP;

Kenji Inage, Tokyo, JP;

Norio Takahashi, Tokyo, JP;

Tatsushi Shimizu, Shatin, CN;

Pak Kin Wong, Shatin, CN;

Assignees:

TDK Corporation, Chuo-Ku, Tokyo, JP;

SAE Magnetics (H.K.) Ltd., Hong Kong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for testing a TMR element includes a step of measuring a plurality of resistances of the TMR element by feeding a plurality of sense currents with different current values each other through the TMR element, a step of calculating a ratio of change in resistance from the measured plurality of resistances of the TMR element, and a step of evaluating the TMR element using the calculated ratio of change in resistance.


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