The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2008

Filed:

Sep. 05, 2006
Applicants:

Takato Machi, Tokyo, JP;

Noriko Chikumoto, Tokyo, JP;

Koichi Nakao, Tokyo, JP;

Hiroshi Fuji, Tokyo, JP;

Yutaka Kitoh, Tokyo, JP;

Teruo Izumi, Tokyo, JP;

Yuh Shiohara, Chigasaki, JP;

Inventors:

Takato Machi, Tokyo, JP;

Noriko Chikumoto, Tokyo, JP;

Koichi Nakao, Tokyo, JP;

Hiroshi Fuji, Tokyo, JP;

Yutaka Kitoh, Tokyo, JP;

Teruo Izumi, Tokyo, JP;

Yuh Shiohara, Chigasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01R 33/032 (2006.01);
U.S. Cl.
CPC ...
Abstract

A continuous observation apparatus of magnetic flux distribution in which a long sample containing a superconducting material or magnetic material is transferred to an observation position and magnetic flux is observed sequentially at each of certain areas along a longitudinal direction of the sample is provided. A method of continuously observing magnetic flux by which a long sample containing a superconducting material or magnetic material is transferred to an observation position and magnetic flux is observed sequentially at each of certain areas along a longitudinal direction of the sample is also provided.


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