The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2008

Filed:

Jun. 16, 2006
Applicants:

Sharon Xiaorong Wang, Hoffman Estates, IL (US);

James Frank Caruba, Bartlett, IL (US);

James T. Chapman, Glen Ellyn, IL (US);

Ronald E. Malmin, Chicago, IL (US);

Joseph Fang, Barrington, IL (US);

Inventors:

Sharon Xiaorong Wang, Hoffman Estates, IL (US);

James Frank Caruba, Bartlett, IL (US);

James T. Chapman, Glen Ellyn, IL (US);

Ronald E. Malmin, Chicago, IL (US);

Joseph Fang, Barrington, IL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/161 (2006.01); G01D 18/00 (2006.01); G12B 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for calibrating a scintillation camera includes steps of constructing a pair of generic linearity coefficient (LC) matrices from a representative detector based on measurement of non-linearity; and transforming the pair of generic LC matrices according to measured pinhole locations from a lead mask to generate detector specific LC matrices.


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