The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2008

Filed:

Oct. 18, 2005
Applicants:

Tatsuo Nakata, Hino, JP;

Masahiro Oba, Hino, JP;

Inventors:

Tatsuo Nakata, Hino, JP;

Masahiro Oba, Hino, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 7/04 (2006.01); G02B 21/00 (2006.01); F21V 9/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A laser scanning microscope which focuses light beams from a laser beam source to a sample by means of an objective lens and detects transmission light from the sample, reflection light, or fluorescence generated from the sample, includes an observation laser scanning optical system which irradiates coherent light from one side of the sample and which carries out scanning the sample, a stimulation laser scanning optical system which irradiates coherent light from an opposite side across the sample and which carries out scanning the sample, an observation light detector provided to be branched from the observation laser scanning optical system, and a light invasion preventing section which prevents the coherent light irradiated from the stimulation laser scanning optical system from invading the observation light detector.


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