The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2008

Filed:

Oct. 29, 2004
Applicants:

Andrew Ward Beale, Mission Viejo, CA (US);

Jason Alan Yelinek, Diamond Bar, CA (US);

Inventors:

Andrew Ward Beale, Mission Viejo, CA (US);

Jason Alan Yelinek, Diamond Bar, CA (US);

Assignee:

Unisys Corporation, Blue Bell, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An embodiment of the invention is a technique to detect data corruption of critical data structures and to repair the corrupted critical data structures. Information data of critical data structures used by a managing module are captured upon initialization of the managing module. The captured information data are considered valid, and stored in a data vault. Critical data structures used by the managing module are monitored for validity during operation of the managing module. A corruption of a critical data structure corresponding to a stored data of the stored captured information data is detected during operation of the managing module. The corrupted data structure is restored to an operational state by using the corresponding stored data in the data vault without interrupting the operation of the managing module.


Find Patent Forward Citations

Beale, Andrew. (2008). Detection and repair of corrupted critical data structures without operational interruption (U.S. Patent No. 7415632). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7415632

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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