The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7415373 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 19, 2008

Filed:

Jun. 23, 2005
Applicants:

Haruhiko Yanamaka, Kobe, JP;

Yasuaki Komatsu, Kobe, JP;

Inventors:

Haruhiko Yanamaka, Kobe, JP;

Yasuaki Komatsu, Kobe, JP;

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/00 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring a frequency translation device under test by using a vector network analyzer and a reference frequency translation device that includes measuring the network characteristics of the reference frequency translation device by using the vector network analyzer, measuring the network characteristics of a circuit including the reference frequency translation device and the frequency translation device under test by using the vector network where the reference frequency translation device has an operation complementary to the frequency translation device under test, and removing the network characteristics of the reference frequency translation device from the measured network characteristics of the circuit.


Find Patent Forward Citations

Yanamaka, Haruhiko. (2008). Method of measuring frequency translation device (U.S. Patent No. 7415373). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7415373

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