The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2008
Filed:
Oct. 04, 2004
Allan J. Volponi, West Simsbury, CT (US);
Allan J. Volponi, West Simsbury, CT (US);
United Technologies Corporation, Hartford, CT (US);
Abstract
Method for detecting faults in a device comprising the steps of receiving a plurality of performance parameters, applying the plurality of performance parameters to a first model to produce a plurality of estimated performance parameters, applying the plurality of performance parameters to a second model to produce a plurality of estimated device parameters, computing a plurality of residuals from the plurality of estimated device parameters, computing a plurality of distance measuring from the plurality of residuals, detecting at least one parameter deviation using the plurality of residuals and the plurality of estimated performance parameters, and setting at least one detection flag if the detected at least one parameter deviation is persistent.