The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2008
Filed:
Jun. 04, 2004
Zhengrong Ying, Wakefield, MA (US);
Ram Naidu, Waban, MA (US);
Sergey Simanovsky, Brookline, MA (US);
Carl R. Crawford, Brookline, MA (US);
Zhengrong Ying, Wakefield, MA (US);
Ram Naidu, Waban, MA (US);
Sergey Simanovsky, Brookline, MA (US);
Carl R. Crawford, Brookline, MA (US);
Analogic Corporation, Peabody, MA (US);
Abstract
A method of and a system for destreaking the photoelectric image in multi-energy computed tomography are provided, wherein the photoelectric projections are generated from the projection data acquired using at least two x-ray spectra for scanned objects; wherein a neighboring scheme is provided; the method comprises computing the statistics including mean and standard deviation using the neighboring scheme; calculating an upper limit and a lower limit from the computed statistics; detecting outliers in the photoelectric projections using the upper and lower limits; and replacing values of outliers using the upper or lower limit.