The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2008
Filed:
Dec. 30, 2003
Applicants:
Jiang Hsieh, Brookfield, WI (US);
Stanley Haim Fox, Brookfield, WI (US);
Inventors:
Jiang Hsieh, Brookfield, WI (US);
Stanley Haim Fox, Brookfield, WI (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for facilitating a reduction in image artifacts is provided. The method includes receiving data regarding a scan of an object, reconstructing a plurality of images using the received data to form a three-dimensional image space, determining an orientation for a maximum intensity pixel operation, locating the maximum intensity pixels within a plurality of ray paths in accordance with the determined orientation, and filtering around each maximum intensity pixel along each ray path.